A structured approach to post-silicon validation and debug using symbolic quick error detection - researchr publication authors

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David Lin, Eshan Singh, Clark Barrett, Subhasish Mitra. A structured approach to post-silicon validation and debug using symbolic quick error detection. In 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015. pages 1-10, IEEE, 2015. [doi]

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