DNAttest: Digital-twin-based Non-intrusive Attestation under Transient Uncertainty - researchr publication authors

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Wei Lin, Heng Chuan Tan, Binbin Chen 0001, Fan Zhang. DNAttest: Digital-twin-based Non-intrusive Attestation under Transient Uncertainty. In 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Network, DSN 2023, Porto, Portugal, June 27-30, 2023. pages 376-388, IEEE, 2023. [doi]

This author has not been identified. Look up 'Wei Lin' in GoogleThis author has not been identified. Look up 'Heng Chuan Tan' in GoogleThis author has not been identified. Look up 'Binbin Chen 0001' in GoogleThis author has not been identified. Look up 'Fan Zhang' in Google

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