Wei Lin, Heng Chuan Tan, Binbin Chen 0001, Fan Zhang. DNAttest: Digital-twin-based Non-intrusive Attestation under Transient Uncertainty. In 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Network, DSN 2023, Porto, Portugal, June 27-30, 2023. pages 376-388, IEEE, 2023. [doi]
Abstract is missing.