Chien-Hsueh Lin, Chih-Ying Tsai, Kao-Chi Lee, Sung-Chu Yu, Wen-Rong Liau, Alex Chun-Liang Hou, Ying-Yen Chen, Chun-Yi Kuo, Jih-Nung Lee, Mango C.-T. Chao. d Measurement. IEEE Trans. on CAD of Integrated Circuits and Systems, 37(10):2139-2151, 2018. [doi]
@article{LinTLYLHCKLC18,
title = {d Measurement},
author = {Chien-Hsueh Lin and Chih-Ying Tsai and Kao-Chi Lee and Sung-Chu Yu and Wen-Rong Liau and Alex Chun-Liang Hou and Ying-Yen Chen and Chun-Yi Kuo and Jih-Nung Lee and Mango C.-T. Chao},
year = {2018},
doi = {10.1109/TCAD.2017.2783304},
url = {https://doi.org/10.1109/TCAD.2017.2783304},
researchr = {https://researchr.org/publication/LinTLYLHCKLC18},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {37},
number = {10},
pages = {2139-2151},
}