Stack sizing analysis and optimization for FinFET logic cells and circuits operating in the sub/near-threshold regime - researchr publication authors

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Xue Lin, Yanzhi Wang, Massoud Pedram. Stack sizing analysis and optimization for FinFET logic cells and circuits operating in the sub/near-threshold regime. In Fifteenth International Symposium on Quality Electronic Design, ISQED 2014, Santa Clara, CA, USA, March 3-5, 2014. pages 341-348, IEEE, 2014. [doi]

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