Lang Lin, Jimin Wen, Harsh Shrivastav, Weike Li, Hua Chen, Gang Ni, Sreeja Chowdhury, Calvin Chow, Norman Chang. Layout-level Vulnerability Ranking from Electromagnetic Fault Injection. In IEEE International Symposium on Hardware Oriented Security and Trust, HOST 2022, McLean, VA, USA, June 27-30, 2022. pages 17-20, IEEE, 2022. [doi]
Abstract is missing.