Illumination-Insensitive Binary Descriptor for Visual Measurement Based on Local Inter-Patch Invariance

Xinyu Lin, Yingjie Zhou, Xun Zhang 0002, Yipeng Liu, Ce Zhu. Illumination-Insensitive Binary Descriptor for Visual Measurement Based on Local Inter-Patch Invariance. IEEE T. Instrumentation and Measurement, 72:1-13, 2023. [doi]

Abstract

Abstract is missing.