J. Th. van der Linden, Mario H. Konijnenburg, Ad J. Van de Goor. Test generation and three-state elements, buses, and bidirectionals. In 12th IEEE VLSI Test Symposium (VTS'94), April 25-28, 1994, Cherry Hill, New Jersey, USA. pages 114-121, IEEE Computer Society, 1994. [doi]
Abstract is missing.