Walter M. Lindermeir, Helmut E. Graeb, Kurt Antreich. Analog testing by characteristic observation inference. IEEE Trans. on CAD of Integrated Circuits and Systems, 18(9):1353-1368, 1999. [doi]
@article{LindermeirGA99,
title = {Analog testing by characteristic observation inference},
author = {Walter M. Lindermeir and Helmut E. Graeb and Kurt Antreich},
year = {1999},
doi = {10.1109/43.784126},
url = {http://doi.ieeecomputersociety.org/10.1109/43.784126},
tags = {testing, e-science},
researchr = {https://researchr.org/publication/LindermeirGA99},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {18},
number = {9},
pages = {1353-1368},
}