W. Lindsay, Ernesto Sánchez, Matteo Sonza Reorda, Giovanni Squillero. Automatic Test Programs Generation Driven by Internal Performance Counters. In Fifth International Workshop on Microprocessor Test and Verification (MTV 2004), Common Challenges and Solutions, 08-10 September 2004, Austin, Texas, USA. pages 8-13, IEEE Computer Society, 2004. [doi]
Abstract is missing.