Scott Lindstrom, Timothy J. Schmit, Mathew M. Gunshor, Jaime Daniels, Kaba Bah, Steven J. Goodman. Latest assessment of GOES-R (16) Advanced Baseline Imager (ABI) data quality from an application and training perspective. In 2017 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2017, Fort Worth, TX, USA, July 23-28, 2017. pages 283-285, IEEE, 2017. [doi]
Abstract is missing.