Model Mis-Specification Analyses of Weibull and Gamma Models Based on One-Shot Device Test Data

Man Ho Ling, Narayanaswamy Balakrishnan 0001. Model Mis-Specification Analyses of Weibull and Gamma Models Based on One-Shot Device Test Data. IEEE Transactions on Reliability, 66(3):641-650, 2017. [doi]

Abstract

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