Test Generation for Non-separable RTL Controller-datapath Circuits using a Satisfiability based Approach - researchr publication authors

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Loganathan Lingappan, Srivaths Ravi, Niraj K. Jha. Test Generation for Non-separable RTL Controller-datapath Circuits using a Satisfiability based Approach. In 21st International Conference on Computer Design (ICCD 2003),VLSI in Computers and Processors, 13-15 October 2003, San Jose, CA, USA, Proceedings. pages 187-193, IEEE Computer Society, 2003. [doi]

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