Loganathan Lingappan, Srivaths Ravi, Anand Raghunathan, Niraj K. Jha, Srimat T. Chakradhar. Heterogeneous and Multi-Level Compression Techniques for Test Volume Reduction in Systems-on-Chip. In 18th International Conference on VLSI Design (VLSI Design 2005), with the 4th International Conference on Embedded Systems Design, 3-7 January 2005, Kolkata, India. pages 65-70, IEEE Computer Society, 2005. [doi]
@inproceedings{LingappanRRJC05, title = {Heterogeneous and Multi-Level Compression Techniques for Test Volume Reduction in Systems-on-Chip}, author = {Loganathan Lingappan and Srivaths Ravi and Anand Raghunathan and Niraj K. Jha and Srimat T. Chakradhar}, year = {2005}, url = {http://csdl.computer.org/comp/proceedings/vlsid/2005/2264/00/22640065abs.htm}, tags = {testing}, researchr = {https://researchr.org/publication/LingappanRRJC05}, cites = {0}, citedby = {0}, pages = {65-70}, booktitle = {18th International Conference on VLSI Design (VLSI Design 2005), with the 4th International Conference on Embedded Systems Design, 3-7 January 2005, Kolkata, India}, publisher = {IEEE Computer Society}, isbn = {0-7695-2264-5}, }