Heterogeneous and Multi-Level Compression Techniques for Test Volume Reduction in Systems-on-Chip

Loganathan Lingappan, Srivaths Ravi, Anand Raghunathan, Niraj K. Jha, Srimat T. Chakradhar. Heterogeneous and Multi-Level Compression Techniques for Test Volume Reduction in Systems-on-Chip. In 18th International Conference on VLSI Design (VLSI Design 2005), with the 4th International Conference on Embedded Systems Design, 3-7 January 2005, Kolkata, India. pages 65-70, IEEE Computer Society, 2005. [doi]

Abstract

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