Tee Chwee Liong, Andy Pascual. Impact of Quad Flat No Lead package (QFN) on automated X-ray inspection (AXI). In Jill Sibert, Janusz Rajski, editors, 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. pages 1-10, IEEE, 2007. [doi]
Abstract is missing.