Juin J. Liou, Chang Jiang, Cao Guang-Biao, Chang Gung, Feng Chia. Challenges of electrostatic discharge (ESD) protection in emerging silicon nanowire technology. In 2011 IEEE 9th International Conference on ASIC, ASICON 2011, Xiamen, China, October 25-28, 2011. pages 256-258, IEEE, 2011. [doi]
Abstract is missing.