Dimitri A. Lisin, Marwan A. Mattar, Matthew B. Blaschko, Erik G. Learned-Miller, Mark C. Benfield. Combining Local and Global Image Features for Object Class Recognition. In IEEE Conference on Computer Vision and Pattern Recognition, CVPR Workshops 2005, San Diego, CA, USA, 21-23 September, 2005. pages 47, IEEE, 2005. [doi]
Abstract is missing.