Degradation Based Long-Term Reliability Assessment for Electronic Components in Submarine Applications - researchr publication authors

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V. Lista, P. Garbossa, T. Tomasi, M. Borgarino, Fausto Fantini, L. Gherardi, A. Righetti, M. Villa. Degradation Based Long-Term Reliability Assessment for Electronic Components in Submarine Applications. Microelectronics Reliability, 42(9-11):1389-1392, 2002. [doi]

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