V. Lista, P. Garbossa, T. Tomasi, M. Borgarino, Fausto Fantini, L. Gherardi, A. Righetti, M. Villa. Degradation Based Long-Term Reliability Assessment for Electronic Components in Submarine Applications. Microelectronics Reliability, 42(9-11):1389-1392, 2002. [doi]
@article{ListaGTBFGRV02,
title = {Degradation Based Long-Term Reliability Assessment for Electronic Components in Submarine Applications},
author = {V. Lista and P. Garbossa and T. Tomasi and M. Borgarino and Fausto Fantini and L. Gherardi and A. Righetti and M. Villa},
year = {2002},
doi = {10.1016/S0026-2714(02)00156-7},
url = {http://dx.doi.org/10.1016/S0026-2714(02)00156-7},
tags = {rule-based, reliability},
researchr = {https://researchr.org/publication/ListaGTBFGRV02},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {42},
number = {9-11},
pages = {1389-1392},
}