Yucheng Liu, Jan P. Allebach. A patch-based cross masking model for natural images with detail loss and additive defects. In Bernice E. Rogowitz, Thrasyvoulos N. Pappas, Huib de Ridder, editors, Human Vision and Electronic Imaging XX, San Francisco, California, USA, February 9-12, 2015. Volume 9394 of SPIE Proceedings, SPIE, 2015. [doi]
Abstract is missing.