Fang Liu, Erkan Acar, Sule Ozev. Test yield estimation for analog/RF circuits over multiple correlated measurements. In Jill Sibert, Janusz Rajski, editors, 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. pages 1-10, IEEE, 2007. [doi]
Abstract is missing.