Yang Liu, ChangChun Chai, Qingyang Fan, Chunlei Shi, Xiaowen Xi, Xinhai Yu, Yintang Yang. Ku band damage characteristics of GaAs pHEMT induced by a front-door coupling microwave pulse. Microelectronics Reliability, 66:32-37, 2016. [doi]
@article{LiuCFSXYY16,
title = {Ku band damage characteristics of GaAs pHEMT induced by a front-door coupling microwave pulse},
author = {Yang Liu and ChangChun Chai and Qingyang Fan and Chunlei Shi and Xiaowen Xi and Xinhai Yu and Yintang Yang},
year = {2016},
doi = {10.1016/j.microrel.2016.09.002},
url = {http://dx.doi.org/10.1016/j.microrel.2016.09.002},
researchr = {https://researchr.org/publication/LiuCFSXYY16},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {66},
pages = {32-37},
}