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Ku band damage characteristics of GaAs pHEMT induced by a front-door coupling microwave pulse

Yang Liu, ChangChun Chai, Qingyang Fan, Chunlei Shi, Xiaowen Xi, Xinhai Yu, Yintang Yang. Ku band damage characteristics of GaAs pHEMT induced by a front-door coupling microwave pulse. Microelectronics Reliability, 66:32-37, 2016. [doi]

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