Novel analysis model for investigation of contact force and scrub length for design of probe card

De-Shin Liu, Chi-Min. Chang, John Liu, Shu-Ching Ho, Hao-Yin Tsai. Novel analysis model for investigation of contact force and scrub length for design of probe card. Microelectronics Reliability, 50(6):872-880, 2010. [doi]

Abstract

Abstract is missing.