An Investigation of ESD-Enhancement by the Drain-side Embedded SCR Area Modulation for HV pLDMOSs - researchr publication authors

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Zhi-Wei Liu, Shen-Li Chen, Jhong-Yi Lai, Xing-Chen Mai, Yu-Jie Chung. An Investigation of ESD-Enhancement by the Drain-side Embedded SCR Area Modulation for HV pLDMOSs. In IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2022, Taipei, Taiwan, July 6-8, 2022. pages 73-74, IEEE, 2022. [doi]

This author has not been identified. Look up 'Zhi-Wei Liu' in GoogleThis author has not been identified. Look up 'Shen-Li Chen' in GoogleThis author has not been identified. Look up 'Jhong-Yi Lai' in GoogleThis author has not been identified. Look up 'Xing-Chen Mai' in GoogleThis author has not been identified. Look up 'Yu-Jie Chung' in Google

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