Zhi-Wei Liu, Shen-Li Chen, Jhong-Yi Lai, Xing-Chen Mai, Yu-Jie Chung. An Investigation of ESD-Enhancement by the Drain-side Embedded SCR Area Modulation for HV pLDMOSs. In IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2022, Taipei, Taiwan, July 6-8, 2022. pages 73-74, IEEE, 2022. [doi]
@inproceedings{LiuCLMC22,
title = {An Investigation of ESD-Enhancement by the Drain-side Embedded SCR Area Modulation for HV pLDMOSs},
author = {Zhi-Wei Liu and Shen-Li Chen and Jhong-Yi Lai and Xing-Chen Mai and Yu-Jie Chung},
year = {2022},
doi = {10.1109/ICCE-Taiwan55306.2022.9869111},
url = {https://doi.org/10.1109/ICCE-Taiwan55306.2022.9869111},
researchr = {https://researchr.org/publication/LiuCLMC22},
cites = {0},
citedby = {0},
pages = {73-74},
booktitle = {IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2022, Taipei, Taiwan, July 6-8, 2022},
publisher = {IEEE},
isbn = {978-1-6654-7050-6},
}