Chen Liu, Wu-Tung Cheng, Huaxing Tang, Sudhakar M. Reddy, Wei Zou, Manish Sharma. Hyperactive Faults Dictionary to Increase Diagnosis Throughput. In 17th IEEE Asian Test Symposium, ATS 2008, Sapporo, Japan, November 24-27, 2008. pages 173-178, IEEE Computer Society, 2008. [doi]
@inproceedings{LiuCTRZS08,
title = {Hyperactive Faults Dictionary to Increase Diagnosis Throughput},
author = {Chen Liu and Wu-Tung Cheng and Huaxing Tang and Sudhakar M. Reddy and Wei Zou and Manish Sharma},
year = {2008},
doi = {10.1109/ATS.2008.16},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2008.16},
researchr = {https://researchr.org/publication/LiuCTRZS08},
cites = {0},
citedby = {0},
pages = {173-178},
booktitle = {17th IEEE Asian Test Symposium, ATS 2008, Sapporo, Japan, November 24-27, 2008},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3396-4},
}