A Practical Inductor Loss Testing Scheme and Device With High Frequency Pulsewidth Modulation Excitations

Baiyi Liu, Wei Chen, Jinghui Wang, Qingbin Chen. A Practical Inductor Loss Testing Scheme and Device With High Frequency Pulsewidth Modulation Excitations. IEEE Transactions on Industrial Electronics, 68(5):4457-4467, 2021. [doi]

Authors

Baiyi Liu

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Wei Chen

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Jinghui Wang

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Qingbin Chen

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