Baiyi Liu, Wei Chen, Jinghui Wang, Qingbin Chen. A Practical Inductor Loss Testing Scheme and Device With High Frequency Pulsewidth Modulation Excitations. IEEE Transactions on Industrial Electronics, 68(5):4457-4467, 2021. [doi]
@article{LiuCWC21,
title = {A Practical Inductor Loss Testing Scheme and Device With High Frequency Pulsewidth Modulation Excitations},
author = {Baiyi Liu and Wei Chen and Jinghui Wang and Qingbin Chen},
year = {2021},
doi = {10.1109/TIE.2020.2984985},
url = {https://doi.org/10.1109/TIE.2020.2984985},
researchr = {https://researchr.org/publication/LiuCWC21},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Industrial Electronics},
volume = {68},
number = {5},
pages = {4457-4467},
}