Ya-Chen Liu, Amare Mulatie Dehnaw, Cheng-Kai Yao 0001, Peng-Chun Peng. Integration of Optical Sensing and Deep Learning for Reliable Defect Detection in Smart Packaging Systems. In IEEE International Conference on Consumer Electronics, ICCE 2026, Dubai, United Arab Emirates, February 3-5, 2026. pages 1-2, IEEE, 2026. [doi]
Abstract is missing.