Rui Liu, Adrian Evans, Qiong Wu, Yuanqing Li, Li Chen, Shi-Jie Wen, Rick Wong, Rita Fung. Analysis of advanced circuits for SET measurement. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 7, IEEE, 2015. [doi]
@inproceedings{LiuEWLCWWF15,
title = {Analysis of advanced circuits for SET measurement},
author = {Rui Liu and Adrian Evans and Qiong Wu and Yuanqing Li and Li Chen and Shi-Jie Wen and Rick Wong and Rita Fung},
year = {2015},
doi = {10.1109/IRPS.2015.7112827},
url = {http://dx.doi.org/10.1109/IRPS.2015.7112827},
researchr = {https://researchr.org/publication/LiuEWLCWWF15},
cites = {0},
citedby = {0},
pages = {7},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015},
publisher = {IEEE},
isbn = {978-1-4673-7362-3},
}