Adrian Evans - researchr alias

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Viewing Publication 1 - 29 from 29

2022

Improving DNN Fault Tolerance in Semantic Segmentation ApplicationsStéphane Burel, Adrian Evans, Lorena Anghel. dft 2022: 1-6 [doi]

2021

MOZART: Masking Outputs with Zeros for Architectural Robustness and Testing of DNN AcceleratorsStéphane Burel, Adrian Evans, Lorena Anghel. iolts 2021: 1-6 [doi]

Zero-Overhead Protection for CNN WeightsStéphane Burel, Adrian Evans, Lorena Anghel. dft 2021: 1-6 [doi]

2018

A Colour Hit-or-Miss Transform Based on a Rank Ordered Distance MeasureFraser Macfarlane, Paul Murray, Stephen Marshall, Benjamin Perret, Adrian Evans, Henry White. eusipco 2018: 588-592 [doi]

2017

2016

A Method to Design Single Error Correction Codes With Fast Decoding for a Subset of Critical BitsPedro Reviriego, Mustafa Demirci, Adrian Evans, Juan Antonio Maestro. tcas, 63-II(2):171-175, 2016. [doi]

RIIF-2: Toward the next generation reliability information interchange formatAlessandro Savino, S. Di Carlo, Alessandro Vallero, Gianfranco Politano, Dimitris Gizopoulos, Adrian Evans. iolts 2016: 173-178 [doi]

2015

A call for cross-layer and cross-domain reliability analysis and managementDan Alexandrescu, Adrian Evans, Enrico Costenaro, Maximilien Glorieux. iolts 2015: 19-22 [doi]

Comprehensive Analysis of Sequential and Combinational Soft Errors in an Embedded ProcessorMojtaba Ebrahimi, Adrian Evans, Mehdi Baradaran Tahoori, Enrico Costenaro, Dan Alexandrescu, Vikas Chandra, Razi Seyyedi. tcad, 34(10):1586-1599, 2015. [doi]

Flip-flop SEU reduction through minimization of the temporal vulnerability factor (TVF)Adrian Evans, Enrico Costenaro, Arkady Bramnik. iolts 2015: 162-167 [doi]

Techniques for heavy ion microbeam analysis of FPGA SER sensitivtyAdrian Evans, Dan Alexandrescu, Veronique Ferlet-Cavrois, Kay-Obbe Voss. irps 2015: 6 [doi]

Analysis of advanced circuits for SET measurementRui Liu, Adrian Evans, Qiong Wu, Yuanqing Li, Li Chen, Shi-Jie Wen, Rick Wong, Rita Fung. irps 2015: 7 [doi]

A Class of SEC-DED-DAEC Codes Derived From Orthogonal Latin Square CodesPedro Reviriego, Salvatore Pontarelli, Adrian Evans, Juan Antonio Maestro. tvlsi, 23(5):968-972, 2015. [doi]

New insights into the impact of SEUs in FPGA CRAMsSheng Wang, Adrian Evans, Shi-Jie Wen, Rick Wong, Gengsheng Chen. ieiceee, 12(6):20150110, 2015. [doi]

2014

Managing SER costs of complex systems through Linear ProgrammingDan Alexandrescu, Nematollah Bidokhti, Andy Yu, Adrian Evans, Enrico Costenaro. iolts 2014: 216-219 [doi]

Comprehensive analysis of alpha and neutron particle-induced soft errors in an embedded processor at nanoscalesMojtaba Ebrahimi, Adrian Evans, Mehdi Baradaran Tahoori, Razi Seyyedi, Enrico Costenaro, Dan Alexandrescu. date 2014: 1-6 [doi]

Connecting different worlds - Technology abstraction for reliability-aware design and TestUlf Schlichtmann, Veit Kleeberger, Jacob A. Abraham, Adrian Evans, Christina Gimmler-Dumont, Michael Glaß, Andreas Herkersdorf, Sani R. Nassif, Norbert Wehn. date 2014: 1-8 [doi]

New approaches for synthesis of redundant combinatorial logic for selective fault toleranceHao Xie, Li Chen, Rui Liu, Adrian Evans, Dan Alexandrescu, Shi-Jie Wen, Rick Wong. iolts 2014: 62-68 [doi]

2013

State-aware single event analysis for sequential logicDan Alexandrescu, Enrico Costenaro, Adrian Evans. iolts 2013: 151-156 [doi]

Clustering techniques and statistical fault injection for selective mitigation of SEUs in flip-flopsAdrian Evans, Michael Nicolaidis, Shi-Jie Wen, Thiago Asis. isqed 2013: 727-732 [doi]

Hot topic session 4A: Reliability analysis of complex digital systemsAdrian Evans, Michael Nicolaidis, Rob Aitken, Burcin Aktan, Olivier Lauzeral. vts 2013: 1 [doi]

Hierarchical RTL-based combinatorial SER estimationAdrian Evans, Dan Alexandrescu, Enrico Costenaro, Liang Chen. iolts 2013: 139-144 [doi]

Error detection in ternary CAMs using bloom filtersSalvatore Pontarelli, Marco Ottavi, Adrian Evans, Shi-Jie Wen. date 2013: 1474-1479 [doi]

Synthesis of Redundant Combinatorial Logic for Selective Fault ToleranceHao Xie, Li Chen, Adrian Evans, Shi-Jie Wen, Rick Wong. prdc 2013: 128-129 [doi]

2012

RIIF - Reliability information interchange formatAdrian Evans, Michael Nicolaidis, Shi-Jie Wen, Dan Alexandrescu, Enrico Costenaro. iolts 2012: 103-108 [doi]

Single event upset tolerance in flip-flop based microprocessor coresStefanos Valadimas, Yiorgos Tsiatouhas, Angela Arapoyanni, Adrian Evans. dft 2012: 79-84 [doi]

1998

Functional Verification of Large ASICsAdrian Evans, Allan Silburt, Gary Vrckovnik, Thane Brown, Mario Dufresne, Geoffrey Hall, Tung Ho, Ying Liu. dac 1998: 650-655 [doi]

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1998

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2022

2021

2018

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2016

2015

2014

2013

2012

1998

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