Adrian Evans, Michael Nicolaidis, Rob Aitken, Burcin Aktan, Olivier Lauzeral. Hot topic session 4A: Reliability analysis of complex digital systems. In 31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013. pages 1, IEEE Computer Society, 2013. [doi]
Abstract is missing.