Ting Liu, Yun Gu, Dai Wang, Yuhong Gui, Xiaohong Guan. A novel method to detect bad data injection attack in smart grid. In 2013 Proceedings IEEE INFOCOM Workshops, Turin, Italy, April 14-19, 2013. pages 49-54, IEEE, 2013. [doi]
@inproceedings{LiuGWGG13a,
title = {A novel method to detect bad data injection attack in smart grid},
author = {Ting Liu and Yun Gu and Dai Wang and Yuhong Gui and Xiaohong Guan},
year = {2013},
doi = {10.1109/INFCOMW.2013.6562907},
url = {http://dx.doi.org/10.1109/INFCOMW.2013.6562907},
researchr = {https://researchr.org/publication/LiuGWGG13a},
cites = {0},
citedby = {0},
pages = {49-54},
booktitle = {2013 Proceedings IEEE INFOCOM Workshops, Turin, Italy, April 14-19, 2013},
publisher = {IEEE},
}