A novel method to detect bad data injection attack in smart grid

Ting Liu, Yun Gu, Dai Wang, Yuhong Gui, Xiaohong Guan. A novel method to detect bad data injection attack in smart grid. In 2013 Proceedings IEEE INFOCOM Workshops, Turin, Italy, April 14-19, 2013. pages 49-54, IEEE, 2013. [doi]

Abstract

Abstract is missing.