Defect classification on limited labeled samples with multiscale feature fusion and semi-supervised learning

Jiahuan Liu, Fei Guo, Yun Zhang 0010, Binkui Hou, Huamin Zhou. Defect classification on limited labeled samples with multiscale feature fusion and semi-supervised learning. Appl. Intell., 52(7):8243-8258, 2022. [doi]

Abstract

Abstract is missing.