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The multi-deformable assembly contact analysis of rotate test tree

Jinghua Liu, Guichuan Hu. The multi-deformable assembly contact analysis of rotate test tree. In Kenji Sugawara, Yingxu Wang, Fumio Hattori, Toyoaki Nishida, Shigeru Fujita, Witold Kinsner, Lotfi A. Zadeh, editors, 11th IEEE International Conference on Cognitive Informatics and Cognitive Computing, ICCI*CC 2012, Kyoto, Japan, August 22-24, 2012. pages 427-430, IEEE, 2012. [doi]

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Jinghua Liu

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Guichuan Hu

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