Jinghua Liu, Guichuan Hu. The multi-deformable assembly contact analysis of rotate test tree. In Kenji Sugawara, Yingxu Wang, Fumio Hattori, Toyoaki Nishida, Shigeru Fujita, Witold Kinsner, Lotfi A. Zadeh, editors, 11th IEEE International Conference on Cognitive Informatics and Cognitive Computing, ICCI*CC 2012, Kyoto, Japan, August 22-24, 2012. pages 427-430, IEEE, 2012. [doi]
@inproceedings{LiuH12-12,
title = {The multi-deformable assembly contact analysis of rotate test tree},
author = {Jinghua Liu and Guichuan Hu},
year = {2012},
doi = {10.1109/ICCI-CC.2012.6311185},
url = {http://dx.doi.org/10.1109/ICCI-CC.2012.6311185},
researchr = {https://researchr.org/publication/LiuH12-12},
cites = {0},
citedby = {0},
pages = {427-430},
booktitle = {11th IEEE International Conference on Cognitive Informatics and Cognitive Computing, ICCI*CC 2012, Kyoto, Japan, August 22-24, 2012},
editor = {Kenji Sugawara and Yingxu Wang and Fumio Hattori and Toyoaki Nishida and Shigeru Fujita and Witold Kinsner and Lotfi A. Zadeh},
publisher = {IEEE},
isbn = {978-1-4673-2794-7},
}