Jun Liu, Yinhe Han, Xiaowei Li. Extended Selective Encoding of Scan Slices for Reducing Test Data and Test Power. In Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan. pages 319-324, IEEE Computer Society, 2009. [doi]
@inproceedings{LiuHL09-3, title = {Extended Selective Encoding of Scan Slices for Reducing Test Data and Test Power}, author = {Jun Liu and Yinhe Han and Xiaowei Li}, year = {2009}, doi = {10.1109/ATS.2009.63}, url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2009.63}, tags = {testing, data-flow, slicing}, researchr = {https://researchr.org/publication/LiuHL09-3}, cites = {0}, citedby = {0}, pages = {319-324}, booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan}, publisher = {IEEE Computer Society}, isbn = {978-0-7695-3864-8}, }