Extended Selective Encoding of Scan Slices for Reducing Test Data and Test Power

Jun Liu, Yinhe Han, Xiaowei Li. Extended Selective Encoding of Scan Slices for Reducing Test Data and Test Power. IEICE Transactions, 93-D(8):2223-2232, 2010. [doi]

Authors

Jun Liu

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Yinhe Han

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Xiaowei Li

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