Jun Liu, Yinhe Han, Xiaowei Li. Extended Selective Encoding of Scan Slices for Reducing Test Data and Test Power. IEICE Transactions, 93-D(8):2223-2232, 2010. [doi]
@article{LiuHL10, title = {Extended Selective Encoding of Scan Slices for Reducing Test Data and Test Power}, author = {Jun Liu and Yinhe Han and Xiaowei Li}, year = {2010}, url = {http://search.ieice.org/bin/summary.php?id=e93-d_8_2223}, tags = {testing, data-flow, slicing}, researchr = {https://researchr.org/publication/LiuHL10}, cites = {0}, citedby = {0}, journal = {IEICE Transactions}, volume = {93-D}, number = {8}, pages = {2223-2232}, }