An Investigation of Electric Field and Breakdown Voltage Models for a Deep Trench Superjunction SiC VDMOS - researchr publication authors

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Tao Liu, Shengdong Hu, Jian-an Wang, Gang Guo, Jun Luo, Yuan Wang, Jingwei Guo, Yanmeng Huo. An Investigation of Electric Field and Breakdown Voltage Models for a Deep Trench Superjunction SiC VDMOS. IEEE Access, 7:145118-145123, 2019. [doi]

This author has not been identified. Look up 'Tao Liu' in GoogleThis author has not been identified. Look up 'Shengdong Hu' in GoogleThis author has not been identified. Look up 'Jian-an Wang' in GoogleThis author has not been identified. Look up 'Gang Guo' in GoogleThis author has not been identified. Look up 'Jun Luo' in GoogleThis author has not been identified. Look up 'Yuan Wang' in GoogleThis author has not been identified. Look up 'Jingwei Guo' in GoogleThis author has not been identified. Look up 'Yanmeng Huo' in Google

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