Tao Liu, Shengdong Hu, Jian-an Wang, Gang Guo, Jun Luo, Yuan Wang, Jingwei Guo, Yanmeng Huo. An Investigation of Electric Field and Breakdown Voltage Models for a Deep Trench Superjunction SiC VDMOS. IEEE Access, 7:145118-145123, 2019. [doi]
Abstract is missing.