Peiyu Liu, Shouling Ji, Xuhong Zhang 0005, Qinming Dai, Kangjie Lu, Lirong Fu, Wenzhi Chen, Peng Cheng, Wenhai Wang, Raheem Beyah. IFIZZ: Deep-State and Efficient Fault-Scenario Generation to Test IoT Firmware. In 36th IEEE/ACM International Conference on Automated Software Engineering, ASE 2021, Melbourne, Australia, November 15-19, 2021. pages 805-816, IEEE, 2021. [doi]
Abstract is missing.