Zhenbao Liu, Zhen Jia, Chi-Man Vong, Shuhui Bu, Junwei Han, Xiaojun Tang. Capturing High-Discriminative Fault Features for Electronics-Rich Analog System via Deep Learning. IEEE Trans. Industrial Informatics, 13(3):1213-1226, 2017. [doi]
@article{LiuJVBHT17,
title = {Capturing High-Discriminative Fault Features for Electronics-Rich Analog System via Deep Learning},
author = {Zhenbao Liu and Zhen Jia and Chi-Man Vong and Shuhui Bu and Junwei Han and Xiaojun Tang},
year = {2017},
doi = {10.1109/TII.2017.2690940},
url = {https://doi.org/10.1109/TII.2017.2690940},
researchr = {https://researchr.org/publication/LiuJVBHT17},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Industrial Informatics},
volume = {13},
number = {3},
pages = {1213-1226},
}