A delay metric for RC circuits based on the Weibull distribution

Frank Liu, Chandramouli V. Kashyap, Charles J. Alpert. A delay metric for RC circuits based on the Weibull distribution. IEEE Trans. on CAD of Integrated Circuits and Systems, 23(3):443-447, 2004. [doi]

Authors

Frank Liu

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Chandramouli V. Kashyap

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Charles J. Alpert

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