Duo Liu, Yi Lin, Po-Chun Huang, Xiao Zhu, Liang Liang. Durable and Energy Efficient In-Memory Frequent-Pattern Mining. IEEE Trans. on CAD of Integrated Circuits and Systems, 36(12):2003-2016, 2017. [doi]
@article{LiuLHZL17,
title = {Durable and Energy Efficient In-Memory Frequent-Pattern Mining},
author = {Duo Liu and Yi Lin and Po-Chun Huang and Xiao Zhu and Liang Liang},
year = {2017},
doi = {10.1109/TCAD.2017.2681077},
url = {https://doi.org/10.1109/TCAD.2017.2681077},
researchr = {https://researchr.org/publication/LiuLHZL17},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {36},
number = {12},
pages = {2003-2016},
}