Fabrication, Characterization and Modeling of CVD based Amorphous Silicon Resistor

Wei Liu, Gang Liu, Bing He, Jie Zhang, Hanlin Qin, Shuai Yuan. Fabrication, Characterization and Modeling of CVD based Amorphous Silicon Resistor. In Fan Ye, Ting-Ao Tang, editors, 14th IEEE International Conference on ASIC, ASICON 2021, Kunming, China, October 26-29, 2021. pages 1-3, IEEE, 2021. [doi]

Abstract

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