A Kernelized Stein Discrepancy for Goodness-of-fit Tests

Qiang Liu, Jason D. Lee, Michael I. Jordan. A Kernelized Stein Discrepancy for Goodness-of-fit Tests. In Maria-Florina Balcan, Kilian Q. Weinberger, editors, Proceedings of the 33nd International Conference on Machine Learning, ICML 2016, New York City, NY, USA, June 19-24, 2016. Volume 48 of JMLR Workshop and Conference Proceedings, pages 276-284, JMLR.org, 2016. [doi]

Abstract

Abstract is missing.